S2MU106X02 IC
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Product Details
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SAMSUNG S2MU106X02 POWER & FAST CHARGING IC REWORK & DIAGNOSTIC GUIDE
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1. FUNCTIONAL ARCHITECTURE & CIRCUIT ROLE:
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- Synchronous Buck Fast Charging (AFC 9V / USB-PD):
* Regulates switching buck battery charging from 5.0V standard USB and 9.0V Samsung Adaptive Fast Charging
(AFC / PD) adapters with high thermal efficiency.
* Dynamically controls the high-side and low-side internal MOSFETs to feed high-current charging into
single-cell high-capacity Li-ion batteries (up to 5000mAh–7000mAh in M-series).
- NVDC (Narrow Voltage DC) Power Path Architecture:
* Uses an internal low-impedance BATFET switch to isolate the system voltage rail (VSYS / VPH_PWR) from
the battery terminal. The phone boots instantly when plugged into a charger even if the battery
is discharged to 0V.
- Integrated Type-C CC Controller & MUIC:
* Detects plug orientation, cable connection, and adapter capabilities via Type-C CC1 / CC2 lines.
Controls analog multiplexing between USB data (DP/DM) and UART diagnostic lines.
- Battery Thermal Monitoring & System Protection:
* Connects directly to the battery NTC thermal network. Halts charging immediately if abnormal cell
temperatures (freezing or overheating) or VBUS over-voltage surges are detected.
2. BOARD-LEVEL FAULT SYMPTOMS:
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- Completely Dead Phone (Zero Ampere Draw / Low Boot Freeze):
* Motherboard fails to turn on; connecting to a DC bench power supply shows either 0.000A or current
freezes at a low value (0.03A–0.08A) without progressing to CPU boot.
- Fake Charging (Charging Logo Shows But Battery Percentage Stagnates or Drains):
* The charging animation appears on the screen, but the USB meter indicates only 0.05A–0.12A current draw,
causing the battery percentage to drop continuously while plugged in.
- Slow Charging (Trapped at 0.45A):
* Phone charges slowly and refuses to trigger "Fast Charging" (9V) because the Type-C CC handshake or
charging registers inside S2MU106X02 are damaged.
- Temperature Warning Triangle (Yellow Triangle with Thermometer):
* The screen flashes a battery temperature warning triangle during charging even when the motherboard
and battery are completely cold (caused by a blown internal ADC sensing line in S2MU106X02).
- Immediate Shutdown When Disconnecting Charger:
* Phone functions normally while plugged into the charger, but cuts off instantly the second the Type-C
cable is unplugged (internal BATFET open-circuit unable to draw power from the battery).
- VBUS or VSYS Short-Circuit:
* Internal high-side FET breakdown shorts the primary power rail to ground (0.000V in diode mode),
preventing any power activation.
- Severe IC Overheating:
* S2MU106X02 gets scalding hot immediately upon inserting the charging cable or battery.
3. STEP-BY-STEP MULTIMETER TESTING & DIAGNOSTICS:
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A. Cold Testing (Diode Mode Check - Battery & Charger Disconnected):
1. Set digital multimeter to Diode Mode. Place RED probe on PCB ground (metal shield frame) and test
components surrounding S2MU106X02 with BLACK probe:
- VBUS Input Filter Capacitors: Normal reading is ~520mV to 680mV (0.000V indicates an input short).
- PMID Capacitors (Internal High-Side Rail): Normal reading is ~480mV to 620mV.
- SW (Switch Node) / External Buck Coil: Normal reading is ~340mV to 460mV.
- VSYS / System Power Rail Capacitors: Normal reading is ~350mV to 480mV.
- VBAT Battery Connection Terminal: Normal reading is ~380mV to 520mV.
- Type-C CC1 / CC2 Pins: Normal reading is ~550mV to 750mV on both lines.
- I2C Communication Lines (SDA / SCL): Normal reading is ~480mV to 650mV.
2. Short-Circuit Verification:
- If VBUS or VSYS measures 0.000V, inject 3.8V DC (limited to 1.5A). Using rosin smoke or a thermal
camera, verify if S2MU106X02 turns transparent/hot; if so, remove the chip.
B. Hot Testing (USB Charger Connected):
1. Plug in an original Samsung 15W/25W Adaptive Fast Charger:
- Measure VBUS input capacitor: Must show 5.0V or 9.0V DC. If voltage remains stuck at 5.0V,
CC handshake negotiation inside S2MU106X02 has failed.
- Measure PMID capacitor: Must show 5.0V or 9.0V DC matching VBUS. If VBUS has voltage but PMID has 0V,
internal reverse-blocking FET is blown.
- Measure buck coil output: Must show stable system voltage (3.6V to 4.35V DC).
- Measure VBAT connector: Must output active charging voltage. If VSYS has voltage but VBAT pin
is 0V, internal BATFET is open.
4. SOLDERING, REBALLING & REWORK SPECIFICATIONS:
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- Micro WLCSP BGA Package:
* S2MU106X02 is an ultra-miniature wafer-level BGA chip with bare silicon glass on top. Localized overheating
or mechanical pressure from tweezers will crack the silicon die.
- IC Desoldering Procedure:
* Shield surrounding plastic connectors and sensitive components with Kapton or aluminum heat tape.
* Apply a small amount of non-corrosive RMA tacky flux around the chip perimeter.
* Hot air rework parameters: Temperature 330°C – 340°C, Airflow 25%–30%.
* Apply heat in gentle circular motions for 15–18 seconds. Once solder balls fully liquefy, lift
the chip straight upward with precision micro-tweezers.
- Motherboard Pad Preparation:
* Apply leaded solder paste (Sn63/Pb37, 183°C) to dilute high-temperature factory lead-free alloy.
* Flatten motherboard micro-pads using fine copper desoldering braid and a soldering iron at 280°C.
* Clean thoroughly with 99% pure Isopropyl Alcohol (IPA); inspect under a microscope to confirm no
bridging or missing traces.
- Reballing Procedure:
* Use a dedicated Samsung S2MU106 / universal charging BGA stencil (0.12mm thickness).
* Scrape 183°C fine-grain leaded solder paste smoothly into all stencil apertures.
* Heat with hot air set to 280°C with low airflow (15%) until bright, uniform solder spheres form.
- Placement & Final Reflow:
* Spread a microscopic film of tacky flux on the PCB footprint.
* Align the Pin 1 index dot precisely with the motherboard silkscreen corner marker.
* Reflow at 305°C – 315°C with 25%–30% airflow; the chip will automatically pull into center alignment
via molten solder surface tension.
* Allow motherboard to cool naturally for 3 to 5 minutes before connecting battery and testing charging current.
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